Litigation and Licensing Support

 

- Locate evidence of invention use through detailed technical search and personal knowledge.

- Provide analytical assistance by recommending techniques to uncover or document use.

- Coordinate, manage, and personally oversee analysis at customer-selected laboratories.

- Review analytical data and provide feedback on integrity of results, including possible weaknesses.

- Assist with understanding technical aspects of invention.

- Develop claim charts to highlight inventive features on analytical results.

- Collect evidence of infringement, noninfringement, or prior art by personally traveling to any location

- Locate prior art through technical searches of web-based document databases, web sites, search result references, internal library.

- Evaluate technical evidence to assist with building strong case, or to assess strength or weaknesses of opposition evidence.

- Provide expert assistance at hearings, depositions, trials.

- Patent Technology and Evidence-of-Use Investigation

 

Mr. York is a uniquely qualified expert in semiconductor device structural analysis and cross-sectional image interpretation. He has personally performed and managed physical laboratory analysis of semiconductor products, and is an expert in physical semiconductor structural laboratory analysis (sample preparation techniques for selective deprocessing, device cross-sectioning, physical reverse engineering of process features, and interpretation of image results) on most products and fabrication processes back to 1979.

 

See a detailed list of Mr. Yorks' previous project experience in this area.

 

See a detailed list of the typical content of Mr. Yorks' previous project reports.